Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection-Reference-Cited by-同舟云学术

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Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published:2023-06-13 Issue:196 Volume: Page:
ISSN:1940-087X
Container-title:Journal of Visualized Experiments
language:en
Short-container-title:JoVE

Author:

Xia Fangzhou,Youcef-Toumi Kamal,Sattel Thomas,Manske Eberhard,Rangelow Ivo W.

Publisher

MyJove Corporation

Subject

General Immunology and Microbiology,General Biochemistry, Genetics and Molecular Biology,General Chemical Engineering,General Neuroscience

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Investigations on tip-based large area nanofabrication and nanometrology using a planar nanopositioning machine (NFM-100);Measurement Science and Technology;2024-05-16

2. Morphometric and Nanomechanical Screening of Peripheral Blood Cells with Atomic Force Microscopy for Label-Free Assessment of Alzheimer’s Disease, Parkinson’s Disease, and Amyotrophic Lateral Sclerosis;International Journal of Molecular Sciences;2023-09-19

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