O interstitial generation and diffusion in high temperature annealed Si/SiO2/Si structures
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.361155
Reference25 articles.
1. Annealing of surface states in polycrystalline‐silicon–gate capacitors
2. Process Optimization of Radiation-Hardened CMOS Integrated Circuits
3. Evidence that similar point defects cause 1/fnoise and radiation-induced-hole trapping in metal-oxide-semiconductor transistors
4. Trapping and trap creation studies on nitrided and reoxidized‐nitrided silicon dioxide films on silicon
5. Moderate‐temperature anneal of 7‐nm thermal SiO2in O2‐ and H2O‐free atmosphere: Effects on Si‐SiO2interface‐trap distribution
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