The role of an ultrathin silicon interlayer at the SiO2‐Ge interface
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.350874
Reference38 articles.
1. Interface engineering with pseudormorphic interlayers: Ge metal‐insulator‐semiconductor structures
2. Gating of germanium surfaces using pseudomorphic silicon interlayers
3. Electrical and microstructural characterisation of an ultrathin silicon interlayer used in a silicon dioxide/germanium-based MIS structure
4. Inversion of n‐Type GaAs Surfaces Using a Silicon‐Silicon Dioxide Insulator Structure
Cited by 22 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Effect of Ultrathin Si Passivation Layer for Ge MOS Structure with La2O3 Gate Dielectric;ECS Transactions;2019-12-18
2. A methodology for characterizing the electrochemical stability of DLC coated interlayers and interfaces;Surface and Coatings Technology;2019-10
3. Preparation and Characterization of Oxide/Semiconductor Interfaces;Advanced Nanomaterials for Solar Cells and Light Emitting Diodes;2019
4. Toward the Atomically Abrupt Interfaces of SiOx/Semiconductor Junctions;Advanced Materials Interfaces;2016-03-01
5. Silicon Surface Passivation Technology for Germanium-Tin P-Channel MOSFETs: Suppression of Germanium and Tin Segregation for Mobility Enhancement;ECS Journal of Solid State Science and Technology;2014
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3