1. School of Electronics and Information Engineering, Hebei University of Technology, Key Laboratory of Electronic Materials and Devices of Tianjin, 5340 Xiping Road, Beihen District, Tianjin 300401, People’s Republic of China
2. State Key Laboratory of Reliability and Intelligence of Electrical Equipment, 5340 Xiping Road, Beichen District, Tianjin 300401, People’s Republic of China