Electrical and optical properties of Si-doped InP grown by solid source molecular beam epitaxy using a valved phosphorus cracker cell

Author:

Zheng H. Q.,Radahakrishnan K.,Yoon S. F.,Ng G. I.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Cited by 20 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Controlled integration of InP nanoislands with CMOS-compatible Si using nanoheteroepitaxy approach;Materials Science in Semiconductor Processing;2024-11

2. Exploring the Internal Radiative Efficiency of Selective Area Nanowires;Journal of Nanomaterials;2019-06-02

3. CMOS-Compatible Antimony-Doped Germanium Epilayers for Mid-Infrared Low-Loss High-Plasma-Frequency Plasmonics;ACS Applied Materials & Interfaces;2019-05-06

4. Mid-IR optical properties of silicon doped InP;Optical Materials Express;2017-06-07

5. Carrier Transport in High-mobility MOSFETs;Carrier Transport in Nanoscale MOS Transistors;2016-10-14

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