Investigation of contact-force dependent effects in conductive atomic force microscopy on Si and GaAs
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2964107
Reference35 articles.
1. Imaging and probing electronic properties of self-assembled InAs quantum dots by atomic force microscopy with conductive tip
2. Conductive-tip atomic force microscopy of CdSe colloidal nanodots
3. Pre-breakdown noise in electrically stressed thin SiO2 layers of MOS devices observed with C-AFM
4. Comparison of SiO2 and HfO2∕SiO2 gate stacks electrical behaviour at a nanometre scale with CAFM
5. Statistics of electrical breakdown field in HfO2 and SiO2 films from millimeter to nanometer length scales
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