Effect of oxygen pressure on the structure and thermal stability of ultrathin Al[sub 2]O[sub 3] films on Si(001)
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Reference27 articles.
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4. Atomic Transport and Chemical Stability during Annealing of UltrathinAl2O3Films on Si
5. Study of ultrathin Al2O3/Si(001) interfaces by using scanning reflection electron microscopy and x-ray photoelectron spectroscopy
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