Next-Generation, Super-Hard-to-Process Substrates and Their High-Efficiency Machining Process Technologies Used to Create Innovative Devices

Author:

Doi Toshiro,

Abstract

SiC, GaN, and diamond are known as super-hard-to-process substrate for next-generation green devices. In this paper, we report on some breakthrough in developing highly efficient processing for such hard-to-process materials, for which we propose improvements in conventional processing, and innovative processing. As part of our project, we developed a “dilatancy pad®” that can efficiently produce high-quality surfaces as well as a high-rigidity, high-speed and high-pressure processing machine. We also designed and prototyped “plasma fusion CMP®,” which is an innovative processing technology fusing CMP (Chemical Mechanical Polishing) with P-CVM (Plasma Chemical Vaporization Machining) to machine super-hard diamond substrates that are considered indispensable for future devices. Before the advent of “singularities” by 2045, super-hard-to-process substrates and ultra-precision polishing technology will become more and more essential.

Publisher

Fuji Technology Press Ltd.

Subject

Industrial and Manufacturing Engineering,Mechanical Engineering

Reference13 articles.

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2. T. Doi, K. Seshimo et al., “Building of super high-efficiency technology based on innovative concept (Establishment of effective polishing process of SiC substrate using Dilatancy pad tool with bowl feed method),” Trans. of the JSME, Vol.81, No.824, pp. 1-12, 2015 (in Japanese).

3. T. Doi, K. Seshimo et al., “Smart polishing of hard-to-machine materials with an innovative dilatancy pad under high-pressure, high-speed, immersed condition,” ECS J. S.S Sci. and Tec., Vol.5, No.10, pp. 598-607, 2016.

4. T. K. Doi, “Open innovation for a brighter future,” Nature, naturejobs13, March 21, 2013.

5. K. Shiozawa, Y. Sano, T. Doi, S. Kurokawa, H. Aida et al., “Development of the innovative CMP/P-CVM combined appatus (2nd report) – Basic A-type and its processing characteristic –,” Proc. of the fall meeting of JSPE, p. 273, 2014 (in Japanese).

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