Laser-annealing-induced features of the Raman spectra of quartz/Si and glass/Si structures-Reference-Cited by-同舟云学术

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Laser-annealing-induced features of the Raman spectra of quartz/Si and glass/Si structures

Published:2014-05 Issue:5 Volume:48 Page:621-624
ISSN:1063-7826
Container-title:Semiconductors
language:en
Short-container-title:Semiconductors

Author:

Konakova R. V.,Kolomys A. F.,Okhrimenko O. B.,Strelchuk V. V.,Svetlichnyi A. M.,Grigoriev M. N.,Konoplev B. G.

Publisher

Pleiades Publishing Ltd

Subject

Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1134/S1063782614050108.pdf

Reference11 articles.

1. F. Kh. Mirzoev, V. Ya. Panchenko, and L. A. Shelepin, Phys. Usp. 39, 1 (1996).

2. Zhijun Yuan, Qihong Lou, Jun Zhou, Jingxing Dong, Yunrong Wei, Zhijiang Wang, Hongming Zhao, and Guohua Wu, Opt. Laser Technol. 41, 380 (2009).

3. V. A. Karachinov, Semiconductors 31, 44 (1997).

4. G. K. Safaraliev, Yu. N. Emirov, M. K. Kurbatov, and B. A. Bilanov, Semiconductors 34, 891 (2000).

5. T. Arguirov, T. Mchedlidze, V. D. Akhmetov, S. Kouteva-Arguirova, M. Kittler, R. Rölver, B. Berghoff, M. Först, D. L. Bätzner, and B. Spangenberg, Appl. Surf. Sci. 254, 1083 (2007).

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Laser Annealing of Oxide Films on the Sapphire Surface;Journal of Russian Laser Research;2015-05

2. Variation of optical parameters of multilayer structures with thin silicon layers at laser annealing;Semiconductor Physics Quantum Electronics and Optoelectronics;2014-06-30

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