Drift-mobility measurements in amorphous semiconductors using traveling-wave method
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.28.4900/fulltext
Reference7 articles.
1. Acoustoelectric measurement of low carrier mobilities in highly resistive films
2. Evidence for Exponential Band Tails in Amorphous Silicon Hydride
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4. Normal modes of carrier waves in semiconductor plates
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