Space-charge-limited conduction for the determination of the midgap density of states in amorphous silicon: Theory and experiment
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.30.3422/fulltext
Reference19 articles.
1. Investigation of the localised state distribution in amorphous Si films
2. Analysis of field-effect and capacitance–voltage measurements in amorphous semiconductors
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4. Determination of the density of states of a-Si:H using the field effect
5. Field effect measurement on the film‐substrate and film‐vacuum interfaces ofa‐Si:H
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