Analysis of field-effect and capacitance–voltage measurements in amorphous semiconductors
Author:
Affiliation:
1. a The James Franck Institute and The Department of Physics, The University of Chicago , Chicago , Illinois , U.S.A.
Publisher
Informa UK Limited
Subject
General Physics and Astronomy,General Chemical Engineering
Link
https://www.tandfonline.com/doi/pdf/10.1080/01418638008225645
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1. Switching Phenomena in Thin Films
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5. Factors influencing the efficiency of amorphous silicon solar cells
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