High-energy x-ray reflectivity of buried interfaces created by wafer bonding
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.63.125408/fulltext
Reference10 articles.
1. The interface structure in directly bonded silicon crystals studied by synchrotron X-ray diffraction
2. Fusion bonding of Si wafers investigated by x ray diffraction
3. Thermal Fluctuations of Freely Suspended Smectic-A Films from Mesoscopic to Molecular Length Scales
4. Principles of Optics
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