Hydrogen Electrochemistry and Stress-Induced Leakage Current in Silica
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.83.372/fulltext
Reference31 articles.
1. Hydrogen model for radiation-induced interface states in SiO2-on-Si Structures: A review of the evidence
2. Atomic hydrogen reactions withPbcenters at the (100) Si/SiO2interface
3. Passivation and depassivation of silicon dangling bonds at the Si/SiO2interface by atomic hydrogen
Cited by 257 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Modeling Degradation and Breakdown in SiO2 and High-k Gate Dielectrics;2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD);2023-09-27
2. A non-defect precursor gate oxide breakdown model;Journal of Applied Physics;2023-06-16
3. Negative Bias-Temperature Instabilities and Low-Frequency Noise in Ge FinFETs;IEEE Transactions on Device and Materials Reliability;2023-03
4. First-Principles Study on the Interaction of H2O and Interface Defects in A-SiO2/Si(100);Frontiers in Materials;2022-05-05
5. Unidirectional Elimination of Hydrogen by a Giant Local Field Saves First- and Last-Mile Performances of Semiconductor Devices;The Journal of Physical Chemistry Letters;2022-02-25
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3