Meyer-Neldel correlation in semiconductors and Mott’s minimum metallic conductivity
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.46.15063/fulltext
Reference16 articles.
1. The random-phase model in non-crystalline systems
2. Influence of interface charges on transport measurements in amorphous silicon films
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5. Photo and dark conductivity of doped amorphous silicon
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