In situ TEM observations of void movement in Ag nanowires affecting the electrical properties under biasing-Reference-Cited by-同舟云学术

In situ TEM observations of void movement in Ag nanowires affecting the electrical properties under biasing

Published:2021 Issue:85 Volume:57 Page:11221-11224
ISSN:1359-7345
Container-title:Chemical Communications
language:en
Short-container-title:Chem. Commun.

Author:

Hsueh Yu-Hsiang¹,Ranjan Ashok¹^ORCID,Lyu Lian-Ming¹,Hsiao Kai-Yuan¹,Lu Ming-Yen¹²^ORCID

Affiliation:

1. Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu 300, Taiwan

2. High Entropy Materials Center, National Tsing Hua University, Hsinchu 300, Taiwan

Abstract

In this study we investigated the electromigration (EM) of metal electrodes and the effect of stacking faults on the EM in Ag nanowires (NWs).

Funder

Ministry of Science and Technology, Taiwan

Publisher

Royal Society of Chemistry (RSC)

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,General Chemistry,Ceramics and Composites,Electronic, Optical and Magnetic Materials,Catalysis

Link

http://pubs.rsc.org/en/content/articlepdf/2021/CC/D1CC03300J

Reference32 articles.

1. A New Transparent Conductor: Silver Nanowire Film Buried at the Surface of a Transparent Polymer

2. Large scale, highly conductive and patterned transparent films of silver nanowires on arbitrary substrates and their application in touch screens

3. Electromechanical Properties of Transparent Conducting Substrates for Flexible Electronic Displays

4. Dynamic Observation of Phase Transformation Behaviors in Indium(III) Selenide Nanowire Based Phase Change Memory

5. Recent advances on electromigration in very-large-scale-integration of interconnects

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