Chemical bond imaging using torsional and flexural higher eigenmodes of qPlus sensors

Author:

Martin-Jimenez Daniel12ORCID,Ruppert Michael G.3ORCID,Ihle Alexander12,Ahles Sebastian42,Wegner Hermann A.42ORCID,Schirmeisen André12ORCID,Ebeling Daniel12ORCID

Affiliation:

1. Institute of Applied Physics (IAP), Justus Liebig University Giessen, Heinrich-Buff-Ring 16, Giessen 35392, Germany

2. Center for Materials Research (LaMa), Justus Liebig University Giessen, Heinrich-Buff-Ring 16, Giessen 35392, Germany

3. University of Newcastle, Callaghan, NSW 2308, Australia

4. Institute of Organic Chemistry, Justus Liebig University Giessen, Heinrich-Buff-Ring 17, Giessen 35392, Germany

Abstract

Non-contact atomic force microscopy (AFM) with CO-functionalized tips allows visualizing the chemical structure of individual adsorbed molecules. Particularly high image contrast is observed by exciting a torsional eigenmode of the AFM sensor.

Funder

Hessisches Ministerium für Wissenschaft und Kunst

Deutsche Forschungsgemeinschaft

Publisher

Royal Society of Chemistry (RSC)

Subject

General Materials Science

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