Fundamental and higher eigenmodes of qPlus sensors with a long probe for vertical-lateral bimodal atomic force microscopy

Author:

Yamada Yuya1ORCID,Ichii Takashi1ORCID,Utsunomiya Toru1ORCID,Kimura Kuniko2,Kobayashi Kei2ORCID,Yamada Hirofumi2,Sugimura Hiroyuki1

Affiliation:

1. Department of Materials Science and Engineering, Kyoto University, Yoshida Honmachi, Sakyo, Kyoto 606-8501, Japan

2. Department of Electronic Science and Engineering, Kyoto University, Katsura, Nishikyo, Kyoto 615-8510, Japan

Abstract

The characteristics of qPlus sensors with a long probe were theoretically studied, and they were applied to bidirectional force microscopy.

Funder

Japan Society for the Promotion of Science

Publisher

Royal Society of Chemistry (RSC)

Subject

General Engineering,General Materials Science,General Chemistry,Atomic and Molecular Physics, and Optics,Bioengineering

Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Stiffness calibration of qPlus sensors at low temperature through thermal noise measurements;Beilstein Journal of Nanotechnology;2024-05-23

2. Spring constant of an AFM cantilever with a thin-film plasmonic waveguide formed at its end;Japanese Journal of Applied Physics;2024-04-01

3. Contact resonance atomic force microscopy using long elastic tips;Nanotechnology;2023-11-29

4. Characteristics Optimization of Tuning Fork-Fiber Probes in Shear Force Scanning Near-Field Optical Microscope;2023 Asia Communications and Photonics Conference/2023 International Photonics and Optoelectronics Meetings (ACP/POEM);2023-11-04

5. Electrochemical AFM/STM with a qPlus sensor: A versatile tool to study solid-liquid interfaces;The Journal of Chemical Physics;2023-11-01

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