Experimental validation of contact resonance AFM using long massive tips

Abstract

Abstract In this work, we present an experimental validation of a new contact resonance atomic force microscopy model developed for sensors with long, massive tips. A derivation of a new technique and graphical method for the identification of the unknown system parameters is presented. The technique and contact resonance model are experimentally validated. The agreement between our contact resonance experimental measurements and values obtained from nanoindentation show a minimal error of 1.4%–4.5% and demonstrate the validity of the new contact resonance model and system parameter identification technique.