Electron microscopy of polyoxometalate ions on graphene by electrospray ion beam deposition-Reference-Cited by-同舟云学术

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Electron microscopy of polyoxometalate ions on graphene by electrospray ion beam deposition

Published:2018 Issue:10 Volume:10 Page:4952-4961
ISSN:2040-3364
Container-title:Nanoscale
language:en
Short-container-title:Nanoscale

Author:

Vats N.¹²³^ORCID,Rauschenbach S.¹²³⁴⁵,Sigle W.¹²³,Sen S.¹²³,Abb S.¹²³,Portz A.⁶⁷⁸³,Dürr M.⁶⁷⁸³,Burghard M.¹²³,van Aken P. A.¹²³,Kern K.¹²³⁹¹⁰

Affiliation:

1. Max Planck Institute for Solid State Research

2. D-70569 Stuttgart

3. Germany

4. Department of Chemistry

5. University of Oxford

6. Institut für Angewandte Physik

7. Justus-Liebig-Universität Giessen

8. 35392 Giessen

9. Institut de Physique

10. École Polytechnique Fédérale de Lausanne

Abstract

We present HRTEM imaging of [PW₁₂O₄₀]³⁻ on graphene after chemically selective deposition by electrospray ion-beam deposition (ES-IBD).

Publisher

Royal Society of Chemistry (RSC)

Subject

General Materials Science

Link

http://pubs.rsc.org/en/content/articlepdf/2018/NR/C8NR00402A

Reference53 articles.

1. Sub-ångstrom resolution using aberration corrected electron optics

2. D. B. Williams and C. B.Carter , in Transmission electron microscopy , Springer , 1996 , pp. 3–17

3. Transmission electron microscopy at 20kV for imaging and spectroscopy

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