Sub-ångstrom resolution using aberration corrected electron optics
Author:
Publisher
Springer Science and Business Media LLC
Subject
Multidisciplinary
Link
http://www.nature.com/articles/nature00972.pdf
Reference20 articles.
1. Scherzer, O. The theoretical resolution limit of the electron microscope. J. Appl. Phys. 20, 20–29 (1949)
2. Haider, M., Uhlemann, S., Schwan, E., Kabius, B. & Urban, K. Electron microscopy image enhanced. Nature 392, 768–769 (1998)
3. Crewe, A. V., Isaacson, M. & Johnson, D. A simple scanning electron microscope. Rev. Sci. Instrum. 40, 241–246 (1969)
4. Voyles, P. M., Muller, D. A., Grazul, J. L., Citrin, P. H. & Gossmann, H.-J. L. Atomic-scale imaging of individual dopant atoms and clusters in highly n-doped bulk Si. Nature 416, 826–829 (2002)
5. Crewe, A. V., Wall, J. & Langmore, J. Visibility of a single atom. Science 168, 1338–1340 (1970)
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