Critical effect of the bottom electrode on the ferroelectricity of epitaxial Hf0.5Zr0.5O2 thin films-Reference-Cited by-同舟云学术

Critical effect of the bottom electrode on the ferroelectricity of epitaxial Hf0.5Zr0.5O2 thin films

Published:2021 Issue:10 Volume:9 Page:3486-3492
ISSN:2050-7526
Container-title:Journal of Materials Chemistry C
language:en
Short-container-title:J. Mater. Chem. C

Author:

Estandía Saúl¹²³⁴^ORCID,Gàzquez Jaume¹²³⁴^ORCID,Varela María⁵⁶⁷⁴,Dix Nico¹²³⁴,Qian Mengdi¹²³⁴,Solanas Raúl¹²³⁴,Fina Ignasi¹²³⁴^ORCID,Sánchez Florencio¹²³⁴^ORCID

Affiliation:

1. Institut de Ciència de Materials de Barcelona (ICMAB-CSIC)

2. Campus UAB

3. Bellaterra 08193

4. Spain

5. Dpto. Física de Materiales & Instituto Pluridisciplinar

6. Universidad Complutense de Madrid

7. Madrid

Abstract

Comparison of a set of perovskite electrodes shows that La_1−x(Ca,Sr)_xMnO₃ is critical to stabilize the ferroelectric orthorhombic phase in epitaxial films. The stabilization is favored if the La content in the manganite is high.

Funder

Fundación BBVA

Departament d'Innovació, Universitats i Empresa, Generalitat de Catalunya

Ministerio de Ciencia e Innovación

Consejo Superior de Investigaciones Científicas

Publisher

Royal Society of Chemistry (RSC)

Subject

Materials Chemistry,General Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2021/TC/D0TC05853J

Reference30 articles.