Reconstructing accurate ToF-SIMS depth profiles for organic materials with differential sputter rates
Author:
Affiliation:
1. National ESCA and Surface Analysis Center for Biomedical Problems (NESAC/BIO)
2. Molecular Engineering and Sciences Institute
3. University of Washington
4. Seattle
5. USA
Abstract
This study describes new methods to transform and correct ToF-SIMS depth profiles of multilayer polymer films exhibiting differential sputter rates.
Funder
National Institute of Biomedical Imaging and Bioengineering
Publisher
Royal Society of Chemistry (RSC)
Subject
Electrochemistry,Spectroscopy,Environmental Chemistry,Biochemistry,Analytical Chemistry
Link
http://pubs.rsc.org/en/content/articlepdf/2015/AN/C5AN00860C
Reference42 articles.
1. Molecular depth profiling of organic photovoltaic heterojunction layers by ToF-SIMS: comparative evaluation of three sputtering beams
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3. Argon Cluster Ion Beams for Organic Depth Profiling: Results from a VAMAS Interlaboratory Study
4. 3D ToF-SIMS Imaging of Polymer Multilayer Films Using Argon Cluster Sputter Depth Profiling
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