3D ToF-SIMS Imaging of Polymer Multilayer Films Using Argon Cluster Sputter Depth Profiling-Reference-Cited by-同舟云学术

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3D ToF-SIMS Imaging of Polymer Multilayer Films Using Argon Cluster Sputter Depth Profiling

Published:2015-01-20 Issue:4 Volume:7 Page:2654-2659
ISSN:1944-8244
Container-title:ACS Applied Materials & Interfaces
language:en
Short-container-title:ACS Appl. Mater. Interfaces

Author:

Bailey James¹,Havelund Rasmus²,Shard Alexander G.²,Gilmore Ian S.²,Alexander Morgan R.³,Sharp James S.¹,Scurr David J.³

Affiliation:

1. School of Physics & Astronomy and Nottingham Nanoscience and Nanotechnology Centre, University of Nottingham, Nottingham NG7 2RD, England

2. National Physical Laboratory, Teddington, Middlesex TW11 0LW, England

3. Laboratory of Biophysics and Surface Analysis, University of Nottingham, Nottingham NG7 2RD, England

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/am507663v

Reference28 articles.

1. Thin film polymer photonics: Spin cast distributed Bragg reflectors and chirped polymer structures

2. Infrared dielectric mirrors based on thin film multilayers of polystyrene and polyvinylpyrrolidone

3. The path to ubiquitous and low-cost organic electronic appliances on plastic

4. Low-cost all-polymer integrated circuits

5. Facile external treatment for efficient nanoscale morphology control of polymer solar cells using a gas-assisted spray method

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