Chemical Visualization of a GaN p-n junction by XPS
Author:
Publisher
Springer Science and Business Media LLC
Subject
Multidisciplinary
Link
http://www.nature.com/articles/srep14091.pdf
Reference57 articles.
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4. Heath, J. T., Jiang, C.-S. & Al-Jassim, M. M. Measurement of semiconductor surface potential using the scanning electron microscope. J. Appl. Phys. 111, 046103 (2012).
5. Li, J. et al. Direct Identification of Metallic and Semiconducting Single-Walled Carbon Nanotubes in Scanning Electron Microscopy. Nano Lett. 12, 4095–4101 (2012).
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