Effect of Cosputtering and Sample Rotation on Improving C60+ Depth Profiling of Materials
Author:
Affiliation:
1. Research Center for Applied Science, Academia Sinica, Tapei 115, Taiwan
2. Department of Materials Science and Engineering, Nation Taiwan University, Taipei 106, Taiwan
Publisher
American Chemical Society (ACS)
Subject
Analytical Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/ac3020824
Reference48 articles.
1. X-ray Photoelectron Spectrometry Depth Profiling of Organic Thin Films Using C60 Sputtering
2. Extremely low sputtering degradation of polytetrafluoroethylene by C60 ion beam applied in XPS analysis
3. Molecular Depth Profiling of Sucrose Films: A Comparative Study of C60n+ Ions and Traditional Cs+ and O2+ Ions
4. The Magic of Cluster SIMS
5. Protocols for Three-Dimensional Molecular Imaging Using Mass Spectrometry
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Effect of energy per atom (E/n) on the Ar gas cluster ion beam (Ar-GCIB) and O2+ cosputter process;The Analyst;2019
2. Improvement of the gas cluster ion beam-(GCIB)-based molecular secondary ion mass spectroscopy (SIMS) depth profile with O2+ cosputtering;The Analyst;2016
3. Rapid label-free determination of ketamine in whole blood using secondary ion mass spectrometry;Talanta;2015-10
4. Effects of the temperature and beam parameters on depth profiles in X-ray photoelectron spectrometry and secondary ion mass spectrometry under C60+–Ar+ cosputtering;Analytica Chimica Acta;2014-12
5. Depth Profiling of Metal Overlayers on Organic Substrates with Cluster SIMS;Analytical Chemistry;2013-10-10
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3