X-ray Photoelectron Spectrometry Depth Profiling of Organic Thin Films Using C60 Sputtering-Reference-Cited by-同舟云学术

X-ray Photoelectron Spectrometry Depth Profiling of Organic Thin Films Using C60 Sputtering

Published:2007-12-15 Issue:2 Volume:80 Page:501-505
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

Chen Ying-Yu¹,Yu Bang-Ying¹,Wang Wei-Ben¹,Hsu Mao-Feng¹,Lin Wei-Chun¹,Lin Yu-Chin¹,Jou Jwo-Huei¹,Shyue Jing-Jong¹

Affiliation:

1. Research Center for Applied Sciences, Academia Sinica, Taipei 115, Taiwan, Republic of China, Department of Materials Science and Engineering, National Tsing Hua University, Hsin-Chu, Taiwan 300, Republic of China, and Department of Materials Science and Engineering, National Taiwan University, Taipei, Taiwan 106, Republic of China

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/ac701899a

Reference18 articles.

1. Ion bombardment of polyimide films

2. Spectroscopic study on sputtered PEDOT·PSS: Role of surface PSS layer

3. Nickel-chromium interface resolution in Auger depth profiles

4. The development of a range of C60 ion beam systems

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