Nickel-chromium interface resolution in Auger depth profiles
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference19 articles.
1. The statistical sputtering contribution to resolution in concentration-depth profiles
2. The depth dependence of the depth resolution in composition-depth profiling with Auger Electron Spectroscopy
3. The ultra-high resolution depth profiling reference material — Ta2O5 anodically grown on Ta
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