Sputter-induced chemical transformation in oxoanions by combination of C60+ and Ar+ ion beams analyzed with X-ray photoelectron spectrometry-Reference-Cited by-同舟云学术

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Sputter-induced chemical transformation in oxoanions by combination of C60+ and Ar+ ion beams analyzed with X-ray photoelectron spectrometry

Published:2009 Issue:5 Volume:134 Page:945
ISSN:0003-2654
Container-title:The Analyst
language:en
Short-container-title:Analyst

Author:

Lin Yu-Chin,Chen Ying-Yu,Yu Bang-Ying,Lin Wei-Chun,Kuo Che-Hung,Shyue Jing-Jong

Publisher

Royal Society of Chemistry (RSC)

Subject

Electrochemistry,Spectroscopy,Environmental Chemistry,Biochemistry,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2009/AN/B814729A

Reference24 articles.

1. High-Resolution TOF-SIMS Imaging of Eukaryotic Cells Preserved in a Trehalose Matrix

2. Protocols for Three-Dimensional Molecular Imaging Using Mass Spectrometry

3. Secondary Ion MS Imaging To Relatively Quantify Cholesterol in the Membranes of Individual Cells from Differentially Treated Populations

4. Secondary Ion MS Imaging of Lipids in Picoliter Vials with a Buckminsterfullerene Ion Source

5. Ion bombardment of polyimide films

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