Depth Profiling of Metal Overlayers on Organic Substrates with Cluster SIMS
Author:
Affiliation:
1. The Pennsylvania State University, Department of Chemistry, University Park, Pennsylvania 16802, United States
2. University of Duisburg-Essen, Department of Physics, 47048 Duisburg, Germany
Publisher
American Chemical Society (ACS)
Subject
Analytical Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/ac402658r
Reference56 articles.
1. Comparison of polyatomic and atomic primary beams for secondary ion mass spectrometry of organics
2. TOF-SIMS with Argon Gas Cluster Ion Beams: A Comparison with C60+
3. A C60 Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry: Its Development and Secondary Ion Yield Characteristics
4. Preliminary evaluation of an SF5+ polyatomic primary ion beam for analysis of organic thin films by secondary ion mass spectrometry
5. Depth Profiling of 4-Acetamindophenol-Doped Poly(lactic acid) Films Using Cluster Secondary Ion Mass Spectrometry
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