ToF-SIMS Depth Profiling of Organic Delta Layers with Low-Energy Cesium Ions: Depth Resolution Assessment-Reference-Cited by-同舟云学术

ToF-SIMS Depth Profiling of Organic Delta Layers with Low-Energy Cesium Ions: Depth Resolution Assessment

Published:2019-05-06 Issue:8 Volume:30 Page:1537-1544
ISSN:1044-0305
Container-title:Journal of the American Society for Mass Spectrometry
language:en
Short-container-title:J. Am. Soc. Mass Spectrom.

Author:

Noël Céline¹,Busby Yan¹,Mine Nicolas¹,Houssiau Laurent¹

Affiliation:

1. Laboratoire Interdisciplinaire de Spectroscopie Electronique (LISE), Namur Institute of Structured Matter (NISM), University of Namur, rue de Bruxelles 61, 5000, Namur, Belgium

Publisher

American Chemical Society (ACS)

Subject

Spectroscopy,Structural Biology

Link

http://link.springer.com/content/pdf/10.1007/s13361-019-02224-4.pdf

Reference17 articles.

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2. Molecular depth profiling of multilayer structures of organic semiconductor materials by secondary ion mass spectrometry with large argon cluster ion beams

3. Molecular depth-profiling of polycarbonate with low-energy Cs+ ions

4. Depth profiling of organic materials using improved ion beam conditions

5. Molecular depth profiling of model biological films using low energy monoatomic ions

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