Nanomechanical Modeling of the Bending Response of Silicon Nanowires

Author:

Zare Pakzad Sina1ORCID,Nasr Esfahani Mohammad2ORCID,Tasdemir Zuhal3,Wollschläger Nicole4,Li Taotao5ORCID,Li XueFei5,Yilmaz Mustafa1,Leblebici Yusuf67,Alaca B. Erdem189ORCID

Affiliation:

1. Department of Mechanical Engineering, Koç University, Sariyer, Istanbul 34450, Turkey

2. School of Physics, Engineering and Technology, University of York, York YO10 5DD, U.K.

3. Laboratory of Micro and Nanotechnology, Paul Scherrer Institute, Forschungsstrasse 111, Villigen PSI, CH-5232, Switzerland

4. Department 5.1: Materialography, fractography and aging of technical materials, Bundesanstalt für Materialforschung und -prüfung (BAM), Unter den Eichen 87, Berlin 12205, Germany

5. School of Electronic Science and Engineering, Nanjing University, Jiangsu 210093, China

6. Microelectronic Systems Laboratory, Swiss Federal Institute of Technology − Lausanne (EPFL), Lausanne CH-1015, Switzerland

7. Rectorate, Sabanci University, Tuzla, Istanbul 34956, Turkey

8. , n2STAR-Koç University Nanofabrication and Nanocharacterization Center for Scientific and Technological Advanced Research, Koç University, Sariyer, Istanbul 34450, Turkey

9. Koç University Surface Technologies Research Center (KUYTAM), Koç University, Sariyer, Istanbul 34450, Turkey

Funder

Türkiye Bilimsel ve Teknolojik Arastirma Kurumu

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Investigation of the Bending Behavior in Silicon Nanowires: A Nanomechanical Modeling Perspective;International Journal of Applied Mechanics;2024-07-12

2. An analytical-atomistic model for elastic behavior of silicon nanowires;Journal of Physics: Materials;2024-07-01

3. High-Throughput Vibrational Testing of Silicon Nanowires;2024 International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS);2024-07-01

4. Mechanical properties of silicon nanowires with native oxide surface state;Materials Today Communications;2024-03

5. Simplified top-down fabrication of sub-micron silicon nanowires;Semiconductor Science and Technology;2023-11-07

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3