Influence of the Chalcogen Element on the Filament Stability in CuIn(Te,Se,S)2/Al2O3 Filamentary Switching Devices
Author:
Affiliation:
1. Department of Solid State Sciences, Ghent University, Krijgslaan 281 (S1), 9000 Ghent, Belgium
2. IMEC, Kapeldreef 75, 3001 Leuven, Belgium
Funder
Universiteit Gent
Fonds Wetenschappelijk Onderzoek
Herculesstichting, Vlaamse Overheid
Publisher
American Chemical Society (ACS)
Subject
General Materials Science
Link
https://pubs.acs.org/doi/pdf/10.1021/acsami.7b18228
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