Fifteen Nanometer Resolved Patterns in Selective Area Atomic Layer Deposition—Defectivity Reduction by Monolayer Design
Author:
Affiliation:
1. International Business Machines—Almaden Research Center, 650 Harry Rd., San Jose, California 95110, United States
2. International Business Machines—Semiconductor Technology Research, 257 Fuller Rd., Albany, New York 12203, United States
Funder
International Business Machines Corporation
Publisher
American Chemical Society (ACS)
Subject
General Materials Science
Link
https://pubs.acs.org/doi/pdf/10.1021/acsami.8b13896
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