Dramatically Enhanced Oxygen Uptake and Ionization Yield of Positive Secondary Ions with C60+ Sputtering
Author:
Affiliation:
1. Research Center for Applied Science, Academia Sinica, Tapei 115, Taiwan
2. Department of Materials Science and Engineering, Nation Taiwan University, Taipei 106, Taiwan
Publisher
American Chemical Society (ACS)
Subject
Analytical Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/ac300147g
Reference46 articles.
1. Extremely low sputtering degradation of polytetrafluoroethylene by C60 ion beam applied in XPS analysis
2. X-ray Photoelectron Spectrometry Depth Profiling of Organic Thin Films Using C60 Sputtering
3. Molecular Depth Profiling of Sucrose Films: A Comparative Study of C60n+ Ions and Traditional Cs+ and O2+ Ions
4. C60+ Secondary Ion Microscopy Using a Delay Line Detector
5. C60 Secondary Ion Mass Spectrometry with a Hybrid-Quadrupole Orthogonal Time-of-Flight Mass Spectrometer
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