C60+ Secondary Ion Microscopy Using a Delay Line Detector-Reference-Cited by-同舟云学术

C60+ Secondary Ion Microscopy Using a Delay Line Detector

Published:2009-12-31 Issue:3 Volume:82 Page:801-807
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

Klerk Leendert A.¹,Lockyer Nicholas P.¹,Kharchenko Andriy¹,MacAleese Luke¹,Dankers Patricia Y. W.¹,Vickerman John C.¹,Heeren Ron M. A.¹

Affiliation:

1. FOM Institute for Atomic and Molecular Physics, Science Park 104, 1098 XG, Amsterdam, Netherlands, Surface Analysis Research Centre, Manchester Interdisciplinary Biocentre, CEAS, The University of Manchester, Manchester M1 7DN, United Kingdom, and Department of Pathology and Medical Biology, University Medical Center Groningen, Hanzeplein 1, 9713 GZ, Groningen, The Netherlands

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/ac902587g

Reference43 articles.

1. MALDI imaging mass spectrometry: molecular snapshots of biochemical systems

2. Imaging mass spectrometry

3. Matrix-enhanced secondary ion mass spectrometry: The Alchemist's solution?

4. Fragmentation at and above surfaces in SIMS: Effects of biomolecular yield enhancing surface modifications

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