Directional Carrier Transport in Micrometer-Thick Gallium Oxide Films for High-Performance Deep-Ultraviolet Photodetection-Reference-Cited by-同舟云学术

Directional Carrier Transport in Micrometer-Thick Gallium Oxide Films for High-Performance Deep-Ultraviolet Photodetection

Published:2023-02-16 Issue:8 Volume:15 Page:10868-10876
ISSN:1944-8244
Container-title:ACS Applied Materials & Interfaces
language:en
Short-container-title:ACS Appl. Mater. Interfaces

Author:

Zhang Wenrui¹²^ORCID,Wang Wei¹,Zhang Jinfu¹,Zhang Tan¹,Chen Li¹^ORCID,Wang Liu¹,Zhang Yu³,Cao Yanwei¹,Ji Li³^ORCID,Ye Jichun¹²^ORCID

Affiliation:

1. Zhejiang Provincial Engineering Research Center of Energy Optoelectronic Materials and Devices, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo 315201, China

2. Yongjiang Laboratory, Ningbo 315201, China

3. State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai 200433, China

Funder

Ministry of Education of the People's Republic of China

Ningbo Municipal Bureau of Science and Technology

Chinese Academy of Sciences

Natural Science Foundation of Zhejiang Province

State Key Laboratory of ASIC and System, Fudan University

Ningbo Municipality

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsami.3c00124

Reference43 articles.

1. Ultrawide‐Bandgap Semiconductors: Research Opportunities and Challenges

2. Review of Ga2O3-based optoelectronic devices

3. A review of Ga2O3materials, processing, and devices

4. Review of gallium-oxide-based solar-blind ultraviolet photodetectors

5. A Strategic Review on Gallium Oxide Based Deep‐Ultraviolet Photodetectors: Recent Progress and Future Prospects

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