Molecular Depth Profiling by Wedged Crater Beveling
Author:
Affiliation:
1. Department of Chemistry, The Pennsylvania State University, University Park, Pennsylvania 16802, United States
2. Faculty of Physics, University of Duisburg-Essen, 47048 Duisburg, Germany
Publisher
American Chemical Society (ACS)
Subject
Analytical Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/ac201502w
Reference31 articles.
1. Depth Profiling of 4-Acetamindophenol-Doped Poly(lactic acid) Films Using Cluster Secondary Ion Mass Spectrometry
2. Molecular Depth Profiling of Multilayer Polymer Films Using Time-of-Flight Secondary Ion Mass Spectrometry
3. Quantitative Molecular Depth Profiling of Organic Delta-Layers by C60 Ion Sputtering and SIMS
4. Depth Resolution During C60+ Profiling of Multilayer Molecular Films
5. Molecular depth profiling and imaging using cluster ion beams with femtosecond laser postionization
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