Chemical Phenomena of Atomic Force Microscopy Scanning-Reference-Cited by-同舟云学术

Chemical Phenomena of Atomic Force Microscopy Scanning

Published:2018-01-30 Issue:5 Volume:90 Page:3475-3481
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

Ievlev Anton V.^ORCID,Brown Chance¹,Burch Matthew J.^ORCID,Agar Joshua C.²,Velarde Gabriel A.²,Martin Lane W.²³^ORCID,Maksymovych Petro,Kalinin Sergei V.,Ovchinnikova Olga S.^ORCID

Affiliation:

1. The Bredesen Center, University of Tennessee, 821 Volunteer Boulevard, Knoxville, Tennessee 37920, United States

2. Department of Materials Science and Engineering, University of California Berkeley, Berkeley, California 94720, United States

3. Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States

Funder

Basic Energy Sciences

Army Research Office

Division of Materials Research

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.analchem.7b05225

Reference36 articles.

1. Atomic Force Microscope

2. SCANNING THERMAL MICROSCOPY

3. Magnetic resonance force microscopy

4. Kelvin probe force microscopy

5. Scanning probe microscopy of thermal conductivity and subsurface properties

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