Orientation Dependence of Electromechanical Characteristics of Defect-free InAs Nanowires-Reference-Cited by-同舟云学术

Orientation Dependence of Electromechanical Characteristics of Defect-free InAs Nanowires

Published:2016-02-04 Issue:3 Volume:16 Page:1787-1793
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Zheng Kun¹,Zhang Zhi,Hu Yibin²,Chen Pingping²,Lu Wei²,Drennan John,Han Xiaodong¹,Zou Jin

Affiliation:

1. Beijing Key Lab of Microstructure and Property of Advanced Material, Institute of Microstructure and Properties of Advanced Materials, Beijing University of Technology, Beijing 100124, China

2. National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu-Tian Road, Shanghai 200083, China

Funder

Ministry of Education of the People's Republic of China

Australian Research Council

National Natural Science Foundation of China

Beijing Nova Program

Beijing City Board of Education Project

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.nanolett.5b04842