XPS Evidence for Negative Ion Formation in SIMS Depth Profiling of Organic Material with Cesium-Reference-Cited by-同舟云学术

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XPS Evidence for Negative Ion Formation in SIMS Depth Profiling of Organic Material with Cesium

Published:2014-11-10 Issue:46 Volume:118 Page:26613-26620
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Wehbe Nimer¹,Pireaux Jean-Jacques¹,Houssiau Laurent¹

Affiliation:

1. Research Centre in Physics of Matter and Radiation, University of Namur, 61 rue de Bruxelles, B 5000 Namur, Belgium

Funder

European Commission

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/jp501851f

Reference16 articles.

1. Direct Evidence of Electron Tunneling in the Ionization of Sputtered Atoms

2. Elemental imaging at the nanoscale: NanoSIMS and complementary techniques for element localisation in plants

3. Molecular depth-profiling of polycarbonate with low-energy Cs+ ions

4. Molecular depth profiling of model biological films using low energy monoatomic ions

5. Molecular depth profiling of polymers with very low energy ions

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Effects of Cs+ and Arn+ ion bombardment on the damage of graphite crystals;Applied Surface Science;2022-05

2. Effect of the molecular weight on the depth profiling of PMMA thin films using low‐energy Cs + sputtering;Surface and Interface Analysis;2021-07-21

3. Investigating the Effects of Chemical Gradients on Performance and Reliability within Perovskite Solar Cells with TOF‐SIMS;Advanced Energy Materials;2020-02-24

4. ToF-SIMS Depth Profiling of Organic Delta Layers with Low-Energy Cesium Ions: Depth Resolution Assessment;Journal of the American Society for Mass Spectrometry;2019-05-06

5. Hybrid Perovskites Depth Profiling with Variable-Size Argon Clusters and Monatomic Ions Beams;Materials;2019-03-02

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