Impact of Defects for AlN Single Crystal Thin Film by Metal Nitride Vapor Phase Epitaxy
Author:
Affiliation:
1. School of Materials Science and Engineering, Hebei University of Technology, Tianjin300132, China
2. Hebei Engineering Laboratory of Photoelectronic Functional Crystals, Hebei University of Technology, Tianjin300130, China
Funder
National Natural Science Foundation of China
S&T Program of Hebei
Research Foundation of Education Bureau of Hebei
Tianjin City
Publisher
American Chemical Society (ACS)
Subject
General Chemical Engineering,General Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/acsomega.2c04626
Reference32 articles.
1. Review—Status and Challenges in Hetero-epitaxial Growth Approach for Large Diameter AlN Single Crystalline Substrates
2. Imaging UVC-induced DNA damage response in models of minimal cancer
3. Piezoelectric Coefficients of Aluminum Nitride and Gallium Nitride
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