Electron-Beam-Induced Current Measurements of Thin-Film Solar Cells-Reference-Cited by-同舟云学术

Electron-Beam-Induced Current Measurements of Thin-Film Solar Cells

Published:2019-08-16 Issue:9 Volume:2 Page:6127-6139
ISSN:2574-0962
Container-title:ACS Applied Energy Materials
language:en
Short-container-title:ACS Appl. Energy Mater.

Author:

Abou-Ras Daniel¹^ORCID,Kirchartz Thomas²³^ORCID

Affiliation:

1. Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Hahn-Meitner-Platz 1, 14109 Berlin, Germany

2. IEK5-Photovoltaik, Forschungszentrum Jülich, 52425 Jülich, Germany

3. Faculty of Engineering and CENIDE, University of Duisburg-Essen, Carl-Benz-Strasse 199, 47057 Duisburg, Germany

Funder

Bundesministerium f??r Wirtschaft und Technologie

Helmholtz-Gemeinschaft

Publisher

American Chemical Society (ACS)

Subject

Electrical and Electronic Engineering,Materials Chemistry,Electrochemistry,Energy Engineering and Power Technology,Chemical Engineering (miscellaneous)

Link

https://pubs.acs.org/doi/pdf/10.1021/acsaem.9b01172

Reference59 articles.

1. The Electron Voltaic Effect

2. The Electron-Voltaic Effect inp−nJunctions Induced by Beta-Particle Bombardment

3. A novel method of semiconductor device measurements

4. The Conductive Mode

5. Charge collection scanning electron microscopy

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