A novel method of semiconductor device measurements-Reference-Cited by-同舟云学术

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A novel method of semiconductor device measurements

Published:1964 Issue:12 Volume:52 Page:1642-1647
ISSN:0018-9219
Container-title:Proceedings of the IEEE
language:
Short-container-title:Proc. IEEE

Author:

Everhart T.E.,Wells O.C.,Matta R.K.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx5/5/31067/01445390.pdf?arnumber=1445390

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