Adapting Conventional SEM and STEM Instruments for Acquisition of Electron-Beam Induced Current (EBIC) Images-Reference-Cited by-同舟云学术

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Adapting Conventional SEM and STEM Instruments for Acquisition of Electron-Beam Induced Current (EBIC) Images

Published:2024-07 Issue:Supplement_1 Volume:30 Page:
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Camino F E¹,Han M G²,Pofelski A²,Rua A³,Kisslinger K¹,Hayes D C⁴,Alban J⁴,Agrawal R⁴

Affiliation:

1. Center for Functional Nanomaterials, Brookhaven National Laboratory , Upton, NY , United States

2. Condensed Matter Physics and Material Science Department, Brookhaven National Laboratory , Upton, NY , United States

3. Department of Physics, University of Puerto Rico , Mayaguez, PR , United States

4. School of Chemical Engineering, Purdue University , West Lafayette, IN , United States

Publisher

Oxford University Press (OUP)

Link

https://academic.oup.com/mam/article-pdf/30/Supplement_1/ozae044.067/58672414/ozae044.067.pdf

Reference4 articles.

1. Electron-Beam-Induced Current Measurements of Thin-Film Solar Cells

2. Direct imaging of electron density with a scanning transmission electron microscope

3. Mapping Conductance and Switching Behavior of Graphene Devices In Situ

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