Effect of Substrate Surface Atom Constitution and The Migration Characteristics of Reactive Atoms on Crystal Structure of MgxZn1–xO Thin Films Deposited by PLD Method-Reference-Cited by-同舟云学术

Effect of Substrate Surface Atom Constitution and The Migration Characteristics of Reactive Atoms on Crystal Structure of MgxZn1–xO Thin Films Deposited by PLD Method

Published:2016-05-31 Issue:23 Volume:120 Page:12568-12577
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Han Shun¹²,Liu Shan Ming¹²,Liu Wen Jun¹²,Cao Pei Jiang¹,Lu You Ming¹,Zeng Yu Xiang¹,Jia Fang¹,Liu Xin Ke¹²,Zhu De Liang¹²,Su Shi Chen³

Affiliation:

1. College of Materials Science and Engineering, Shenzhen University, Shenzhen, Guangdong 518060, P. R. China

2. Key Laboratory of Special Functional Materials, Shenzhen, Guangdong 518060, P. R. China

3. Guangdong Engineering Research Center of Optoelectronic Functional Materials and Devices, Institute of Optoelectronic Materials and Technology,South China Normal University, Guangzhou, Guangdong 510631, P. R. China

Funder

National Natural Science Foundation of China

Guangdong Province

Natural Science Foundation of Shenzhen University

Shenzhen Municipaly

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.6b03141

Reference55 articles.