Kelvin Probe Force Microscopy Study of LaAlO<SUB>3</SUB>/SrTiO<SUB>3</SUB> Heterointerfaces-Reference-Cited by-同舟云学术

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Kelvin Probe Force Microscopy Study of LaAlO₃/SrTiO₃ Heterointerfaces

Published:2010-04-01 Issue:1 Volume:5 Page:26-30
ISSN:2156-7573
Container-title:Journal of Advanced Microscopy Research
language:en
Short-container-title:J. Adv. Microsc. Res.

Author:

Popok Vladimir N.,Kalabukhov Alexey,Gunnarsson Robert,Lemeshko Sergey,Claeson Tord,Winkler Dag

Publisher

American Scientific Publishers

Subject

Instrumentation,General Materials Science

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Two-dimensional electron gas at the AlGaN/GaN interface: Layer thickness dependence;Journal of Applied Physics;2020-03-21

2. Electrical domain writing and nanoscale potential modulation on LaVO3/SrTiO3;Applied Physics Letters;2017-06-26

3. Simulation and Verification of Tip-Induced Polarization During Kelvin Probe Force Microscopy Measurements on Film Capacitors;Springer Proceedings in Physics;2016-11-10

4. Modelling and experimental verification of tip-induced polarization in Kelvin probe force microscopy measurements on dielectric surfaces;Journal of Applied Physics;2015-11-21

5. Reversible metal-insulator transition of Ar-irradiatedLaAlO3/SrTiO3interfaces;Physical Review B;2015-10-19

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