Simulation and Verification of Tip-Induced Polarization During Kelvin Probe Force Microscopy Measurements on Film Capacitors
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Publisher
Springer International Publishing
Link
http://link.springer.com/content/pdf/10.1007/978-3-319-46601-9_25
Reference15 articles.
1. Nonnenmacher, M., O’Boyle, M.P., Wickramasinghe, H.K.: Kelvin probe force microscopy. Appl. Phys. Lett. 58, 2921–2923 (1991). doi: 10.1063/1.105227
2. Melitz, W., Shen, J., Kummel, A.C., Lee, S.: Kelvin probe force microscopy and its application. Surf. Sci. Rep. 66, 1–27 (2011). doi: 10.1016/j.surfrep.2010.10.001
3. Kou, L., Ma, Z., Li, Y.J., Naitoh, Y., Komiyama, M., Sugawara, Y.: Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback. Nanotechnology 26, 195701 (2015). doi: 10.1088/0957-4484/26/19/195701
4. Barth, C., Henry, C.R.: Surface double layer on (001) surfaces of alkali halide crystals: a scanning force microscopy study. Phys. Rev. Lett. 98, 136804 (2007). doi: 10.1103/PhysRevLett.98.136804
5. Nowak, R., Moraru, D., Mizuno, T., Jablonski, R., Tabe, M.: Potential profile and photovoltaic effect in nanoscale lateral pn junction observed by Kelvin probe force microscop. Thin Solid Films 557, 249–253 (2014). doi: 10.1016/j.tsf.2013.08.115
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