Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback-Reference-Cited by-同舟云学术

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Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback

Published:2015-04-21 Issue:19 Volume:26 Page:195701
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Kou Lili,Ma Zongmin,Li Yan Jun,Naitoh Yoshitaka,Komiyama Masaharu,Sugawara Yasuhiro

Funder

Japan Society for the Promotion of Science

Global COE Grants

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://stacks.iop.org/0957-4484/26/i=19/a=195701/pdf

Reference43 articles.

1. Atomic Force Microscope

2. Investigation of the (001) cleavage plane of potassium bromide with an atomic force microscope at 4.2 K in ultra-high vacuum

3. Frequency modulation detection using high‐Qcantilevers for enhanced force microscope sensitivity

4. Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy

5. Defect Motion on an InP(110) Surface Observed with Noncontact Atomic Force Microscopy

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1. Investigation of atomic surface potential on Si(111)-7×7 surface by high-frequency heterodyne-Kelvin probe force microscopy;Surfaces and Interfaces;2024-06

2. Study of CO molecules on Pd/Al2O3/NiAl(110) surface by atomic force microscopy and Kelvin probe force microscopy;Journal of Nanoparticle Research;2023-06-30

3. KPFM Study on the Charge Sign Reversal during Nanoscale Triboelectric Charging Induced by a Worn Tip and Sample Pretreatment;The Journal of Physical Chemistry C;2021-09-30

4. Charge Behavior of Terminal Hydroxyl on Rutile TiO2(110);Langmuir;2021-08-26

5. Dynamic behavior of OH and its atomic contrast with O adatom on the Ti site of TiO2(110) at 78 K by atomic force microscopy imaging;Applied Physics Letters;2020-08-03

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