Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Cited by
17 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Time-Multiplexed 1687-Network for Test Cost Reduction;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2018-08
2. Robust Optimization of Test-Access Architectures Under Realistic Scenarios;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2015-11
3. Optimal Test Time and Power for System-On-Chip Designs Using Game Theory;Lecture Notes in Electrical Engineering;2011
4. Power-Aware System-Level Test Planning;Power-Aware Testing and Test Strategies for Low Power Devices;2009-08-13
5. Test-Length and TAM Optimization for Wafer-Level Reduced Pin-Count Testing of Core-Based SoCs;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2009-01